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Fischer Technology Inc.

July 2013 - The Fischerscope X-Ray XDV-SDD nondestructively measures the phosphorus content and thickness of electroless nickel coatings. XRF hardware, combined with advanced fundamental parameter software, yields fast and accurate results with minimal sample preparation. The phosphorus content of electroless nickel coatings is critical to determine the corrosion and wear resistance, hardness and solderability.

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