July 2009 - The Niton XL3t series analyzer with geometrically large area drift detector technology improves light element detection, overall sensitivity and measurement times. The technology offers faster analysis and greater precision while enabling analysis of light elements such as magnesium, aluminum, silicon, phosphorus and sulfur without helium or vacuum purging. See a demonstration at the 2009 Quality Expo Chicago, Rosemont, Ill., from Sept. 22 to Sept. 24.